doubledoublebonuspoker| Dual Element Technology (688623.SH): The wafer AOI dislocation detection system test prototype has passed manufacturer verification and received a small number of orders

Gelonghui May 24 丨 Shuangyuan Technology (688623doubledoublebonuspoker.SH) Disclosure of Investor Relations Activity Record Form showsdoubledoublebonuspoker, the company's technical research and development continues to expand into the field of semiconductor quantity detection, and has completed prototype research and development of a fully automatic wafer AOI quantity detection system and an online wafer spectral measurement system. As of April 30, 2024, the test prototype of the company's wafer AOI dislocation detection system has passed manufacturer verification and received a small number of orders. The equipment is based on the principle of brightfield reflection and uses high-magnification optical microscope imaging technology to achieve high-speed, accurate, and non-contact non-destructive optical detection of dislocation defects on SiC wafers. Combined with AI identification algorithms, TSD, TED, and BPD defects in wafers can be accurately identified and classified. The signing of this order marks the company's official entry into the field of semiconductor quantity testing.